New Mitutoyo MF/MF-U® Generation D measuring microscope Raises bar for accuracy, ease of use, throughput
(Aurora, IL) Mitutoyo America Corporation announces availability of new, generation D MF/MF-U® measuring microscopes. The new MF/MF-U® measuring microscopes offer the long working-distance objectives and sub-micron accuracy glass scales of previous models to which they add the following enhancements:
• Three-axis, motor-driven positioning with variable speed joystick control and collision prevention (Z axis) to reduce operator fatigue and increase accuracy.
• The motorized X-, Y- and Z-axis motor functions that can be combined with a new Mitutoyo Vision Unit to produce a new levels of automation in toolmaker microscopes. • Laser Auto-Focus (LAF) models provide high accuracy and repeatability in two modes of operation: Just Focus (JF) mode for quick focusing and Tracking Focus (TF) for maintaining focus as the stage moves.
• Many optical options are available including magnification levels, BF/DF and LED illumination.
High repeatability and productivity make the new Mitutoyo MF/MF-U® microscope ideal for measurement of cutting tools, molds and other machined components. Semi-conductor wafer holders specific to the generation D MF/MF-U® measuring microscope are available.
Additionally, new MF/MF-U® Measuring Microscopes can support output to measurement data applications such as MeasurLink®, Mitutoyo’s proprietary statistical-processing and process-control program which performs statistical analysis and provides real-time display of measurement results for SPC Software applications. The program can also be linked to a higher-level network environment for enterprise-wide functionality.